000 00396nam a2200133Ia 4500
008 140208s9999 xx 000 0 und d
044 _aUnited Kingdom
080 _a578.15 SI15M
100 _aSiegel, Benjamin, ed.
245 _aModern development in electron microscopy
_cedited by Benjamin M. Siegel
260 _bAcademic Press
_aLondon
_c1964
300 _axiii, 432p.; 24cm.
942 _2udc
_cGB
999 _c2340
_d2340